Description

Introduction

SEM3200 is a tungsten filament scanning electron microscope with high performance and wide application. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user‑friendly environment to characterize samples.What’s more, rich scalability helps the users to explore the world of microscopic imaging.

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Product Advantages

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Product Features

> Low Voltage

Imaging of the carbon material specimen, the penetration depth of the specimen is small under lo w voltage(3kV) of secondary electron mode, the more surface de tail information.

> Low Vacuum

The filer tube material has poor electrical conductivity, and charging with out coating in high vacuum condition, but can be directly imaged in low vacuum condition.

> Large Field of View

With a large field of vie w, the overall morphology and head structure de tails of ladybug c an be easily obtained, and the cross-scale analysis can be displayed.

> Optical Navigation

See where you want, the navigation is easier to achieve. The standard configuration in-chamber camera can take high-definition photos of the sample stage，and samples can be quickly located.

> Collision Prevention Technology

Multi-dimensional anti-collision scheme:

1.The height of the sample can be input ted manually, and the distance between the sample top and the end of the objective lens can be accurately controlled to prevent collision.

2. Based on image recognition and dynamic capture technology, you can acquire the real-time image in chamber during the movement of the sample.

3.*Hardware anti-collision, which can stop the motor immediately at the moment of collision and reduce collision damage.

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Application Field & Cases

Specifications

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